Detecting stacking faults during epitaxial growth by low energy electron diffraction

Cómo citar

H. Ascolani, & J.R. Cerda, & P.L. de Andres, & J.J. de Miguel, & R. Miranda, & K. Heinz (1996). Detecting stacking faults during epitaxial growth by low energy electron diffraction. https://doi.org/10.1016/0039-6028(95)00881-0